- #Bruker apex can i change frames location software#
- #Bruker apex can i change frames location series#
Samples up to 25mm in diameter and 30 mm in height can be loaded in less tha 30 seconds.Įmpyrean Series 2 X-Ray Diffraction System (XRD), Small Hall, Lab 273 A wide range of sample types, including metals, polymers and biologicals can be analyzed. Advantages of this Phenom system include easy operation and simple sample preparation. The Phenom is a high resolution desktop scanning electron Microscope (SEM) with a light optical color camera. (User Instructions) \ Sample Holder Assembly Video Elemental analysis of a sample can be performed using EDAX Energy-Dispersive X-Ray Spectroscopy capabilities. Digital images may be acquired in BMP, TIFF, or JPEG file formats. Spatial resolution of up to 1.5 nm at 15 kV, 12 mm WD and 2.5 nm at 1 k, 2.5 mm WD. The FE-SEM has a magnification range between 30x and 500,000x. The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. Hitachi S-4700 Field Emission Scanning Electron Microscope (FE-SEM) with Energy-Dispersive X-Ray Spectroscopy, ISC2- 2107A Images can also be saved to a USB flash drive for future use. The Phenom ProX is a very compact, quiet, and a low maintenance addition to the lab. The Phenom ProX system includes a 19 inch flat panel touch screen monitor which is used to view, compare, and measure sample images at a maximum 2048 x 2048 pixel resolution. Samples up to 32 mm in diameter and 100 mm in height can be loaded in less than 30 seconds. A wide range of sample types, such as metals, polymers and biologicals, can be viewed at magnifications between 80x to 130,000x. Advantages of the Phenom ProX system include easy operation and simple sample preparation. The Phenom ProX desktop SEM includes an optical color camera and an elemental identification feature with fully integrated EDS that will enhance our current analysis capabilities. Phenom ProX DesktopScanning Electron Microscope (SEM) with EDS, ISC3-1223 Analytical applications include statistical analysis of trace (ppm) contamination and multiple defects on silicon wafers and magnetism analysis of surface contamination, drug delivery cross-section media, high spatial resolution surface and cross-section samples and failure analysis samples. Performance capabilities include one parameter tuning used for insulating samples, library of high mass resolution reference spectra and high-speed SIMS imaging setup and acquisition. Tof-SIMS provides spectroscopy for characterization of chemical composition and imaging for determining the distribution of chemical species and depth profiling for thin film characterization. Tof-SIMS is an analytical technique that uses a primary ion beam in an ultrahigh vacuum environment to probe the surface of a solid material. Thrift II Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS), ISC3-1223 Common roughness parameters can also be measured on both flat or curved surfaces.
#Bruker apex can i change frames location software#
Software capab ilities include measurements for surface roughness, topography, and step heights.
Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and phase-shifting interferometry ( PSI). Please contact the ARC Core Labs for questions and assistance.Ĭontact Us Profilm3D Surface Profiler, ISC3-1223
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